Advances in Imaging and Electron Physics
Edited by- Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Audience
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Included in series
Advances in Imaging and Electron Physics
Advances in Imaging and Electron Physics
Hardbound, 376 Pages
Published: February 2009
Imprint: Academic Press
ISBN: 978-0-12-374762-4
Contents
- 1. Photometric Stereo: an overview, M. Petrou, A. Vasileios2. The Fourier Transform in Clifford Analysis, F. Brackx, N. De Schepper, F. Sommen3. Carbon nanotube electron sources for electron microscopes, N. de Jonge4. Localized Waves: A Review, E. Recami, M. Zamboni-Rached
