Advances in Imaging and Electron Physics
- Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
The invention of the electron microscope more than 70 years ago made it possible to visualize a new world, far smaller than anything that could be seen with the traditional microscope. The biologist could study viruses and the components of cells, the materials scientist could study the structure of metals and alloys and many other substances, and especially their defects. But even the electron microscope had limits, and truly atomic structure was still too small to be observed directly. The so-called "limit of resolution" of the microscope was well understood, but attempts to use the necessary correctors were unsuccessful until the late 1990s. Such correctors now equip many microscopes in Europe, the USA and Japan and the results are extremely impressive. Moreover, microscopists feel that they are only at the beginning of a new era of subatomic microscopic imaging. In the present volume, we have brought together the principal contributors, instrument designers and microscopists to discuss this topic in depth.View full description
All users of electron microscopes as well as physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.
- Published: December 2008
- Imprint: ACADEMIC PRESS
- ISBN: 978-0-12-374220-9
Table of ContentsHistory of aberration correction in electron microscopy (H. Rose)Present and future hexapole aberration correctors for high resolution electron microscopy (M. Haider)Aberration correction and STEM (O.L. Krivanek)First results using the Nion third order STEM corrector (P. Batson) STEM and EELS: Mapping materials atom by atom (A.B. Bleloch) Aberration correction with the SACTEM-Toulouse: from imaging to diffraction (M. HÃ¿tch, F. HÃ¼e, E. Snoeck and F. Houdellier) Novel aberration corrections concepts (B. Kabius) Aberration corrected imaging in CTEM and STEM (A. Kirkland, P.D. Nellist, Lan-Yun Chang and S.J. Haigh)Materials applications of aberration-corrected STEM (S.J. Pennycook, M. F. Chisholm, A. R. Lupini, M. Varela, K. van Benthem, A. Y. Borisevich, M. P. Oxley, W. Luo and S. T. Pantelides)Spherical aberration corrected transmission electron microscopy for nanomaterials in Japan (N. Tanaka)Aberration correction in practice (K. Urban and J. Mayer) Aberration-corrected electron microscopes at Brookhaven National Laboratory (Y. Zhu and J. Wall)