Advances in Imaging and Electron Physics

Series Editor:

  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


Book information

  • Published: August 2008
  • ISBN: 978-0-12-374219-3

Table of Contents

Complex-valued neural network and complex-valued BP, by Tohru Nitta'Disorder', structured diffuse scattering and local crystal chemistry, by Ray L. WithersNonlinear systems for image processing, by S. Morfu, P. Marquié, B. Nofiélé and D. GinhacThe Foldy-Wouthuysen transformation technique in optics, by Sameen Ahmed KhanStack filters: from definition to design algorithms, by Nina HirataBlind source separation: the sparsity revolution, by Jean-Luc Sparck, J. Bobin, Y. Moudden and M.J. Fadili