Advances in Imaging and Electron Physics
By- Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Audience
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Included in series
Advances in Imaging and Electron Physics
Advances in Imaging and Electron Physics
Hardbound, 240 Pages
Published: April 2007
Imprint: Academic Press
ISBN: 978-0-12-373908-7
Contents
- Spiral phase microscopy (S. Fürhapter et al.).
LULU theory, idempotent stack filters and the mathematics of vision of Marr (C. Rohwer, M. Wild).
Geometry of prior selection (H. Snoussi).
