Advances in Imaging and Electron Physics
- Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.
- Published: September 2006
- Imprint: ACADEMIC PRESS
- ISBN: 978-0-12-014785-4
Table of ContentsElectron-Beam-Induced Nanometer-Scale Deposition (C.W. Hagen, N. Silvis-Cividjian).
Electron-Beam-Induced Deposition: A Literature Survey.
The Theory of EBID Spatial Resolution.
The Role of Secondary Electrons in EBID.
Delocalization Effects in EBID.