Advances in Imaging and Electron Physics

Edited by

  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Audience

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

 

Book information

  • Published: May 2006
  • Imprint: ACADEMIC PRESS
  • ISBN: 978-0-12-014781-6


Table of Contents

Retrieval of Shape from Silhouette (A. Bottino, A. Laurentini).Projective Transforms on Periodic Discrete Image Arrays (A. Kingston, I. Svalbe).Ray Tracing in Spherical Interfaces Using Geometric Algebra (Q.M. Sugon, Jr., D.J. McNamara).Prolate Spheroidal Wave Functions and Wavelets (G.G. Walter).