Advances in Imaging and Electron Physics
Edited by- Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Audience
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.
Included in series
Advances in Imaging and Electron Physics
Advances in Imaging and Electron Physics
,
Published: October 2005
Imprint: Academic Press
ISBN: 978-0-12-014780-9
Contents
- Chapter 1 - Spectral Color Spaces: Their Structure and Transformations (LENZ);Chapter 2 - Phase Contrast Enhancement with Phase Plates in Electron Microscopy (NAGAYAMA);Chapter 3 - A Study of Optical Properties of Gas Phase Field Ionization Sources (LIU and Orloff);Chapter 4 - On Symmetric and Nonsymmetric Divergence Measures and Their Generalizations (TANEJA);Chapter 5 - Features and Future of the International System of Units (SI) (VALDES);Chapter 6 - The Importance Sampling Hough Transform (WALSH)
