Advances in Imaging and Electron Physics

Edited by

  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.


Book information

  • Published: October 2005
  • ISBN: 978-0-12-014780-9

Table of Contents

Chapter 1 - Spectral Color Spaces: Their Structure and Transformations (LENZ);Chapter 2 - Phase Contrast Enhancement with Phase Plates in Electron Microscopy (NAGAYAMA);Chapter 3 - A Study of Optical Properties of Gas Phase Field Ionization Sources (LIU and Orloff);Chapter 4 - On Symmetric and Nonsymmetric Divergence Measures and Their Generalizations (TANEJA);Chapter 5 - Features and Future of the International System of Units (SI) (VALDES);Chapter 6 - The Importance Sampling Hough Transform (WALSH)