Advances in Imaging and Electron Physics


  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics.Several of these topics are covered in this volume, which opens with a longchapter of monograph stature on quantitative electron microscopy at theatomic resolution level by scientists from a well-known and verydistinguished Antwerp University Laboratory. This is unique in that thestatistical aspects are explored fully. This is followed by a contributionby A.M. Grigoryan and S.S. Again on transform-based image enhancement,covering both frequency-ordered systems and tensor approaches. The volumeconcludes with an account of the problems of image registration and ways ofsolving them by Maria Petrou of the University of Surrey; feature detection,related image transforms and quality measures are examined separately.The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.
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Researchers, academics, physicists and engineers working in the field of image and electron physics


Book information

  • Published: May 2004
  • ISBN: 978-0-12-014772-4

Table of Contents

Chapter 1 – Statistical Experimental…, (Van DYCK et al)Chapter 2 - Transform-Based.., (GRIGORYAN/AGAIAN)Chapter 3 – Image Registration (PETROU)