Advances in Imaging and Electron Physics
Edited by- Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics.The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.
Audience
Researchers, academics, physicists and engineers working in the field of image and electron physics
Included in series
Advances in Imaging and Electron Physics
Advances in Imaging and Electron Physics
Hardbound, 407 Pages
Published: July 2003
Imprint: Academic Press
ISBN: 978-0-12-014769-4
Contents
- Scanning Nonlinear Dielectric Microscopy; High Order Accurate Methods in Time-Domain Computational Electromagnetics; Pre filtering for Pattern Recognition Using Wavelet Transform and Neural Networks; Electron Optics and Electron Microscopy: Conference Proceedings and Abstracts as source Material.
