Advances in Imaging and Electron Physics

Edited by

  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
  • Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
  • Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.

Image processing and a major contribution on microscopy dominate the latest volume of these advances. This volume looks at theory and it's application in a practical sense, with a full account of the methods used and realistic detailed application. The authors do this by examining the latest developments, historic illustrations and mathematical fundamentals of the exciting developments in imaging and applying them to realistic practical situations.Addressing and solving daily issues faced by researchers, consultants and engineers working in this field, makes this book essential reading
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Researchers, academics, physicists and engineers working in the field of image and electron physics


Book information

  • Published: May 2003
  • ISBN: 978-0-12-014768-7

Table of Contents

A Wavelet-Based Method for Mutlifractal Image Analysis: From Theoretical Concepts to Experimental Applications, An analysis of the Geometric Distortions Produced by Median and Related Image Processing Filters, Two-Photon Excitation Microscopy, Phase Closure Imaging, Three Dimensional Image Processing and Optical Scanning Holography, Nonlinear Image Processing using Artificial Neural Networks