Advances in Imaging and Electron Physics

Advances in Electron Microscopy and Diffraction

By

  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Audience

Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering

 

Book information

  • Published: October 2002
  • Imprint: ACADEMIC PRESS
  • ISBN: 978-0-12-014765-6