Advances in Imaging and Electron Physics
- Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
- Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
- Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
- Published: March 2002
- Imprint: ACADEMIC PRESS
- ISBN: 978-0-12-014763-2
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. The Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." --J.A. Chapman in LABORATORY PRACTICE