Advances in Imaging and Electron Physics
Edited by- Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Audience
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
Advances in Imaging and Electron Physics
Hardbound, 451 Pages
Published: June 2001
Imprint: Academic Press
ISBN: 978-0-12-014758-8

