Advances in Imaging and Electron Physics
- Jay Theodore Cremer, Jr., Chief Scientist, Adelphi Technology, Inc.
This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general