Advances in Imaging and Electron Physics, 99

  • Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
    • Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
      • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France


      Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.


Book information

  • Published: September 1997
  • ISBN: 978-0-12-014741-0


"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."

"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulatedon bringing together in a convenient and comprehensible form a variety of topics of current interest."

Table of Contents

P.T. Jackway, Morphological Scale-Spaces. C.L.F. Ma, M.J. Deen, and L.E. Tarof, Characterization and Modelling of SAGCM InP/InGaAs Avalanche. C.L.F. Ma, M.J. Deen, and L.E. Tarof, Photodiodes for MultigigabitOptical Fiber Communications. G. Matteucci, G.F. Missiroli, and G. Pozzi, Electron Holography of Long Range Electrostatic Fields. N. Mori and T. Oikawa, The Imaging Plate and Its Applications. A. De Santis, A. Germani, and L. Jetto, Space-Variant Image Restoration.