Advances in Imaging and Electron Physics, 98

  • Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
    • Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
      • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

      Audience

      Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.

 

Book information

  • Published: October 1996
  • Imprint: ACADEMIC PRESS
  • ISBN: 978-0-12-014740-3

Reviews

"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics and Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
--MRS BULLETIN


"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical and Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
--J.A. Chapman in LABORATORY PRACTICE



Table of Contents

D. Greenspan, Quantitative Particle Modeling. C.M. Krowne, Theory of the Recursive Dyadic Greens Function for Inhomogeneous Ferrite Canonically-Shaped Circulators. M. Mankos, M.R. Scheinfein, and J.M. Cowley,Electron Holography and Lorentz Microscopy of Magnetic Materials. Subject Index.