Advances in Imaging and Electron Physics, 118

  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
    • Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
      • Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.

      Audience

      Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.

 

Book information

  • Published: September 2001
  • Imprint: ACADEMIC PRESS
  • ISBN: 978-0-12-014760-1