Advances in Imaging and Electron Physics, 118

  • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
    • Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
      • Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.

      Audience
      Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.

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Published: September 2001

Imprint: Academic Press

ISBN: 978-0-12-014760-1

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