Advances in Imaging and Electron Physics, 113
- Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
- Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
- Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Audience
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
Included in series
Advances in Imaging and Electron Physics
Advances in Imaging and Electron Physics
,
Published: April 2000
Imprint: Academic Press
ISBN: 978-0-12-014755-7
Reviews
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ting by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
--MRS BULLETIN
"With the accelerating pace of research and development in so many areas of microscopy, keeeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
--J.A. Chapman in LABORATORY PRACTICE
