Advances in Imaging and Electron Physics, 103

  • Tom Mulvey, Aston University, Department of Electronic Engineering and Applied Physics, U.K.
    • Benjamin Kazan, Xerox Corporation, Palo Alto, California, U.S.A.
      • Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

      Audience

      Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.

 

Book information

  • Published: June 1998
  • Imprint: ACADEMIC PRESS
  • ISBN: 978-0-12-014745-8

Reviews

"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics and Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
Praise for the Previous Volumes, --MRS BULLETIN


"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical and Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
Praise for the Previous Volumes, --J.A. Chapman in LABORATORY PRACTICE



Table of Contents

Contributors. Preface. E. Heyman and T. Melamed, Space-Time Representation of Ultra Wideband Signals. J.J. Koenderink and A.J. van Doorn, The Structure of Relief. C.M. Krowne, Dyadic Green's Function Microstrip Circulator Theory for Inhomogeneous Ferrite With and Without Penetrable Walls. M.I. Yavor, Charged Particle Optics of Systems with Narrow Gaps: A Perturbation Theory Approach. Subject Index.